Publication        
      
      
      
  
      
      
                  Superlattices and Microstructures        
      
      
      
  
      
      
                  Ma, H.; Wang, X.; Chen, J.; Gao, X.; Zheng, S.; Mao, H.; Wang, D.; Zeng, X.; Xu, K.        
      
      
      
  
      
      
                  X-Ray diffraction (XRD), Raman scattering, Cathodoluminescence measurements (CL) and Photoluminescence (PL) were employed to characterize the structure and optical properties of Dysprosium (Dy) and Europium (Eu) implanted GaN films grown by MOCVD.