Publication
Superlattices and Microstructures
Ma, H.; Wang, X.; Chen, J.; Gao, X.; Zheng, S.; Mao, H.; Wang, D.; Zeng, X.; Xu, K.
X-Ray diffraction (XRD), Raman scattering, Cathodoluminescence measurements (CL) and Photoluminescence (PL) were employed to characterize the structure and optical properties of Dysprosium (Dy) and Europium (Eu) implanted GaN films grown by MOCVD.